ANSI EIA 364-32C-2000 pdf download.Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets
1.1 Scope
This test is conducted for the purpose of determining the resistance of a given electrical connector or socket to exposure at extremes of high and low temperatures and to the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. NOTE — This procedure includes the provision for testing at cryogenic temperatures. Cryogenic temperatures should only be used with specimens specifically designed to be compatible with such temperatures.
2 Test resources
2.1 Equipment
2.1.1 A thermal shock chamber or two separate chambers (hot and cold) shall be used for the extreme temperature conditions.
2.1.2 When applicable, a dewar large enough to hold a sufficient amount of liquid nitrogen to completely engulf the specimen shall be utilized.
2.1.3 The air temperature of the chamber shall be held at each of the extreme temperatures by means of air circulation and sufficient thermal capacity so that the ambient temperature within the chamber shall reach the specified temperature within 2 minutes after the specimens have been transferred to the appropriate chamber.
2.1.4 When two separate chambers (hot and cold) are used the specimens shall be supported in the test chamber on metal screens or grills having at least 75% open area.
2.1.5 Transfer of the specimens from one chamber to the another or to dewar of liquid nitrogen shall be performed with thermally insulated handling equipment or gloves in order to minimize direct heat conduction.
3 Test specimen
3.1 Description A test specimen shall consist of a plug, a receptacle, or a mated plug and receptacle, as defined in the referencing document.
3.2 Preparation
3.2.1 The test specimen shall be assembled with contacts, wires and sealing plugs, prior to the test, unless otherwise specified.
3.2.2 The wire lengths shall be of sufficient continuous length to interconnect the test specimen and test equipment, as may be specified for pre- and post-test measurements.
3.2.3 Specimens not normally equipped with an integral coupling device shall be maintained in the simulated mated condition by a suitable fixture. The fixture shall be made as light weight as possible and of low thermal capacity material, in order to reduce “heat sink” effects that would reduce the severity of thermal shock. For specimen mass determination prior to wiring the specimen; see 4.3.
4 Test procedure
4.1 Mounting
The specimens shall be placed in such a position with respect to the air stream that there is substantially no obstruction to the flow of air across and around each specimen. When special mounting is required, it shall be specified.
4.2 Initial measurements
Specified measurements shall be made prior to the first cycle, and they shall be made at standard ambient conditions.
4.3 Specimen mass determination
Before cycling, the combined mass of the assembly (mated, if applicable) to be tested shall be determined. The mass shall include contacts, sealing plugs and specimen accessories attached to the specimen and wire. The weight of any fixture used to hold the specimens in the mated condition shall also be determined. The mass of the specimen in table 1 is the total mass of the mated assembly, wire and any fixture attached to the specimen. The mass of wiring to the specimens (e.g. polarizing voltage, low level contact resistance measurements, or when testing cable assemblies) in the confines of the chamber shall be included in the mass determination.ANSI EIA 364-32C-2000 pdf download
